**Raw-CDO measurement of a raw CDO** | Integration period | *T*_{int} | Determines the total amount of chips, hence, bins in measuring a raw CDO |

Proportion of a code-phase bin to a chip | BIN | Determines the length of each bin, hence, the number of sample points probably incorporated by the measurement |

Sampling frequency | *F*_{S} | Determines the density of sample points on chip waveforms |

Double-sided PCBw | *BW* | Determines the shape of chip waveforms, hence, the values of sample points and the shape of the correlation function (signal amplitude estimate) |

**CDO normalization** | Signal amplitude estimate | *I*_{P} | Determines normalized magnitudes of CDOs |

**Metric definition** | Rising edge rate | RER | Determines the total amount of rising edges within a given integration period in measuring CDOs applied to form metrics |

**Metric-smoothing** | Metric-smoothing period | *T*_{smt} | Decreases the magnitudes of standard deviations of poorly temporally-correlated nominal errors |

**Determination of nominal metrics and detection thresholds** | Nominal scale multiplier | *K* | Determines the inflated scales of nominal noise on metrics |

Minimum number of stations for reference-smoothing | *N*_{ref} | Decreases the magnitudes of standard deviations of poorly- and/or non-spatially-correlated nominal errors |

Carrier-to-noise ratio | *C*/*N*_{0} | Determines the raw magnitudes of nominal noise on received signals |