Raw-CDO measurement of a raw CDO | Integration period | Tint | Determines the total amount of chips, hence, bins in measuring a raw CDO |
Proportion of a code-phase bin to a chip | BIN | Determines the length of each bin, hence, the number of sample points probably incorporated by the measurement |
Sampling frequency | FS | Determines the density of sample points on chip waveforms |
Double-sided PCBw | BW | Determines the shape of chip waveforms, hence, the values of sample points and the shape of the correlation function (signal amplitude estimate) |
CDO normalization | Signal amplitude estimate | IP | Determines normalized magnitudes of CDOs |
Metric definition | Rising edge rate | RER | Determines the total amount of rising edges within a given integration period in measuring CDOs applied to form metrics |
Metric-smoothing | Metric-smoothing period | Tsmt | Decreases the magnitudes of standard deviations of poorly temporally-correlated nominal errors |
Determination of nominal metrics and detection thresholds | Nominal scale multiplier | K | Determines the inflated scales of nominal noise on metrics |
Minimum number of stations for reference-smoothing | Nref | Decreases the magnitudes of standard deviations of poorly- and/or non-spatially-correlated nominal errors |
Carrier-to-noise ratio | C/N0 | Determines the raw magnitudes of nominal noise on received signals |